Notification: Evaluation of Office of Pesticide Programsâ€™ Genetically Engineered Corn Insect Resistance Management These results will assist in assessing resistance risk for different WCR populations, and can be used to improve insect resistance management strategies. Two markers were found to be correlated with both diet (R2 = 0.14) and plant (R2 = 0.23) bioassays for resistance. Markers tightly linked with resistance were validated using WCR populations collected from Cr圓Bb1 maize fields showing significant WCR damage from across the US Corn Belt. Our results indicate that resistance is inherited in a nearly recessive manner and associated with a single autosomal linkage group. A field-derived WCR population known to be resistant to the Cr圓Bb1 Bt toxin was used to generate a genetic map and to identify a genomic region associated with Cr圓Bb1 resistance. Here, we discover and validate genetic markers in WCR that are associated with resistance to the Cr圓Bb1 Bt toxin. Developing genetic markers for resistance will help in characterizing the extent of existing issues, predicting where future field failures may occur, improving insect resistance management strategies, and in designing and sustainably implementing forthcoming WCR control products. Instances of resistance to Bt toxins have been reported in WCR. However, cultivation of Bt-expressing maize places intense selection pressure on pest populations to evolve resistance. Transgenic maize expressing insecticidal toxins derived from the bacterium Bacillus thuringiensis ( Bt) are widely used for the management of WCR. Western corn rootworm (WCR) is a major maize (Zea mays L.) pest leading to annual economic losses of more than 1 billion dollars in the United States. Genetic markers for western corn rootworm resistance to Bt toxin.įlagel, Lex E Swarup, Shilpa Chen, Mao Bauer, Christopher Wanjugi, Humphrey Carroll, Matthew Hill, Patrick Tuscan, Meghan Bansal, Raman Flannagan, Ronald Clark, Thomas L Michel, Andrew P Head, Graham P Goldman, Barry S

Swarup, Shilpa Chen, Mao Bauer, Christopher Wanjugi, Humphrey Carroll, Matthew Hill, Patrick Tuscan, Meghan Bansal, Raman Flannagan, Ronald Clark, Thomas L. Genetic Markers for Western Corn Rootworm Resistance to Bt Toxinįlagel, Lex E.

Tpo toefl huang jin yue du